Structural Characterization of Selected Indian Coals by X-ray Diffraction and Spectroscopic Techniques
نویسندگان
چکیده
منابع مشابه
Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملX-ray Diffraction and IR Spectroscopic Characterization of AgLnTiO4 Oxides Related to the K2NiF4 Structural Type
Uma série de óxidos ternários do tipo AgLnTiO 4 (com Ln = La, Nd, Sm, Eu, Gd, Dy, Y) foi preparada e os seus parâmetros de cela unitária foram determinados por difratometria de raios X. Esses compostos são relacionados com os do tipo estrutural K 2 NiF 4 , com os cátions Ag e Ln distribuídos de uma maneira ordenada no sub-retículo dos íons potássio. Os espectros de absorção no infravermelho des...
متن کاملnano-structural characterization of post-annealed zno thin films by x-ray diffraction and field emission scanning electron microscopy
zno thin films were deposited on si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°c). dependence of the crystallographic structure, nano-strain, chemical composition and surface physical morphology of these layers on annealing temperature were studied. the crystallographic structure of films was studied using x-ray diffracti...
متن کاملSurface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis
An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Trends in Applied Sciences Research
سال: 2012
ISSN: 1819-3579
DOI: 10.3923/tasr.2012.434.444